Characterization of photovoltaic devices by spectroscopic ellipsometry

Characterization of photovoltaic devices by spectroscopic ellipsometry

This application illustrates the ability of the technique to characteriza photovolatic devices. The materials commonly studied include: amorphous silicon, poly silicon, ZnO, ITO, SNO2, TiO2, SiNx, MgO, etc...

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UVISEL PLUS-HORIBA
MoreSpectroscopic Ellipsometer - UVISEL Plus
FUV to NIR: 190 to 2100 nm