Characterization of photovoltaic devices

by Spectroscopic Ellipsometry

This application illustrates the ability of the technique to characteriza photovolatic devices. The materials commonly studied include: amorphous silicon, poly silicon, ZnO, ITO, SNO2, TiO2, SiNx, MgO, etc...

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Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

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