Hybrid organic-inorganic perovskite materials have emerged over the past five years as promising absorber layers for new high-efficiency and low-cost solar cells that combine the advantages of organic and inorganic semiconductors. The increasing interest in this technology is pushing research laboratories to find the optimal techniques for the accurate characterization of opto-electronic properties of these materials.
Spectroscopic ellipsometry (SE) turns out to be an efficient technique to study the optical response of this new class of materials. Indeed, properties like optical absorption and energy band gap are crucial for the efficient design of photovoltaic devices. In this note, a SE study of the most common perovskite methylammonium lead iodide (CH3NH3PbI3) thin film is presented. We show the performance of SE for the characterization of layers deposited using different techniques, revealing the impact of the deposition onto the structural properties of the material, and also the key role of this characterization technique for studying the degradation of perovskite layers after exposure to air.
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