X-Ray Fluorescence (XRF) spectroscopy is widely used for qualitative and quantitative analysis of substances. This technology requires little or no sample preparation. New capabilities of XRF analytical microscopes (micro-XRF) equipped with X-ray optics enable the recording spectra of tiny glass particles (as little as 10-500 microns), in addition to a hyperspectral image of objects with high spatial resolution. The X-ray fluorescence spectrum of the materials strongly depends on the X-ray optical system, the detector's sensitivity, and accelerating voltage. The background from a substrate will also contribute to the spectrum of the small pieces because excitation X-ray penetrates through the material and interacts with substrate. This effect becomes significant for microparticles. The change in the spectrum due to the acceleration voltage of the X-ray generator, X-ray optics, shape, or size will lead to the sample's different spectral profiles.
This presentation will show the spectra from bulk material and small pieces and a comparative analysis of the concentration profiles. Statistics of the measurements of bulk glasses and microparticles with different shapes will be presented and discussed. The application of Multivariate analysis for the classification and quantification of commercial glasses will be shown.