Scientific

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Scientific

Surface Characterization

Surface characterization instruments measure physical, mechanical and chemical parameters of an interface such as thin films and coatings. These instruments are used to measure optical properties, film thickness, composition, morphology and other parameters related to surface analysis.

HORIBA provides a wide range of surface characterization instruments including:

  • Spectroscopic Ellipsometers
  • Glow Discharge Optical Emission Spectrometers
  • Atomic Force Microscope
  • Raman Spectrometer 

 

These instruments are used over a broad range of market such as:

  • Material Sciences for nanomaterials, graphene, quantum dots
  • Semiconductor for display technology, light emitting diodes, data storage
  • Energy for battery, photovoltaics cells

Spectroscopic Ellipsometers

Glow Discharge Optical Emission Spectrometers

Atomic Force Microscope

Raman Spectrometer

Browse Products

Auto SE-HORIBA
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Spectroscopic Ellipsometer for Simple Thin Film Measurement

SmartSE-HORIBA
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Powerful and Cost Effective Spectroscopic Ellipsometer

UVISEL In-Line Spectroscopic Ellipsometer
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In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

UVISEL 2-HORIBA
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Spectroscopic Ellipsometer

UVISEL 2 VUV HORIBA
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A versatile spectroscopic ellipsometer covering a large range from VUV to NIR

UVISEL PLUS-HORIBA
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Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

UVISEL PLUS IN SITU Ellipsometry HORIBA FR
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In-situ spectroscopic ellipsometer for real-time thin film monitoring