Scientific

Scientific

Surface Characterization

Surface characterization instruments measure physical, mechanical and chemical parameters of an interface such as thin films and coatings. These instruments are used to measure optical properties, film thickness, composition, morphology and other parameters related to surface analysis.

HORIBA provides a wide range of surface characterization instruments including:

  • Spectroscopic Ellipsometers
  • Glow Discharge Optical Emission Spectrometers
  • Atomic Force Microscope
  • Raman Spectrometer 

 

These instruments are used over a broad range of market such as:

  • Material Sciences for nanomaterials, graphene, quantum dots
  • Semiconductor for display technology, light emitting diodes, data storage
  • Energy for battery, photovoltaics cells

Spectroscopic Ellipsometers

Glow Discharge Optical Emission Spectrometers

Atomic Force Microscope

Raman Spectrometer

Browse Products

Auto SE-HORIBA
MoreSpectroscopic Ellipsometer - Auto SE
Simple Thin Film Measurement Tool!
UVISEL In-Line Spectroscopic Ellipsometer
MoreSpectroscopic Ellipsometer - In-Line
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
SmartSE-HORIBA
MoreSpectroscopic Ellipsometer - Smart SE
Powerful and Cost Effective Spectroscopic Ellipsometer
UVISEL 2-HORIBA
MoreSpectroscopic Ellipsometer - UVISEL 2
Scientific Spectroscopic Ellipsometer Platform
UVISEL PLUS-HORIBA
MoreSpectroscopic Ellipsometer - UVISEL Plus
FUV to NIR: 190 to 2100 nm
UVISEL PLUS IN SITU Ellipsometry HORIBA FR
MoreSpectroscopic Ellipsometer - UVISEL Plus In-Situ
In-situ spectroscopic ellipsometer for real-time thin film monitoring
UVISEL 2 VUV HORIBA
MoreSpectroscopic Ellipsometer UVISEL 2 VUV
A versatile spectroscopic ellipsometer covering a large range from VUV to NIR