Scientific

Sharing Light and Passion 200 Years of Optical Innovation

Scientific

Surface Characterization

Surface characterization instruments measure physical, mechanical and chemical parameters of an interface such as thin films and coatings. These instruments are used to measure optical properties, film thickness, composition, morphology and other parameters related to surface analysis.

HORIBA provides a wide range of surface characterization instruments including:

  • Spectroscopic Ellipsometers
  • Glow Discharge Optical Emission Spectrometers
  • Atomic Force Microscope
  • Raman Spectrometer 

 

These instruments are used over a broad range of market such as:

  • Material Sciences for nanomaterials, graphene, quantum dots
  • Semiconductor for display technology, light emitting diodes, data storage
  • Energy for battery, photovoltaics cells

Spectroscopic Ellipsometers

Glow Discharge Optical Emission Spectrometers

Atomic Force Microscope

Raman Spectrometer

Browse Products

Auto SE
More Auto SE

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Smart SE
More Smart SE

Powerful and Cost Effective Spectroscopic Ellipsometer

Spectroscopic Ellipsometer - In-Line
More Spectroscopic Ellipsometer - In-Line

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

UVISEL 2
More UVISEL 2

Spectroscopic Ellipsometer

UVISEL 2 VUV
More UVISEL 2 VUV

A versatile spectroscopic ellipsometer covering a large range from VUV to NIR

UVISEL Plus
More UVISEL Plus

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

UVISEL Plus In-Situ
More UVISEL Plus In-Situ

In-situ spectroscopic ellipsometer for real-time thin film monitoring