AFM-Raman - XploRA Nano

AFM-Raman XploRA Nano

Physical and Chemical imaging

Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.

Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.

Segment: Scientific
Division: Molecular and Microanalysis
Base product
Manufacturing Company: HORIBA France SAS

Multi-sample analysis platform

Macro, micro and nano scale measurements can be performed on the same platform.

Ease-of-use

Fully automated operation, start measuring within minutes, not hours!

True confocality

High spatial resolution, automated mapping stages, full microscope visualization options.

High collection efficiency

Top-down and oblique Raman detection for optimum resolution and throughput in both

co-localized and Tip-Enhanced measurements (Raman and Photoluminescence).

High spectral resolution

Ultimate spectral resolution performance, multiple gratings with automated switching, wide spectral range analysis for Raman and PL.

High spatial resolution

Nanoscale spectroscopic resolution (down to 10 nm) through Tip Enhanced

Optical Spectroscopies (Raman and PhotoLuminescence).

Multi-technique / Multi-environment

Numerous SPM modes including AFM, conductive and electrical modes (cAFM,

KPFM), STM, liquid cell and electrochemical environment, together with chemical mapping

through TERS/TEPL. Full control of the 2 instruments through one workstation and a powerful software control, SPM and spectrometer can be operated simultaneously or independently

Robustness/Stability

High resonance frequency AFM scanners, operation far away from noises! High

performance is obtained without active vibration isolation.

 

SmartSPM Scanner and Base

Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)

Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %

Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth

Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)

X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm

Sample size: Maximum 40 x 50 mm, 15 mm thickness

Sample positioning: Motorized sample positioning range 5 x 5 mm

Positioning resolution: 1 µm

AFM Head

Laser wavelength: 1300 nm, non-interfering with spectroscopic detector

Alignment: Fully automated cantilever and photodiode alignment

Probe access: Free access to the probe for additional external manipulators and probes

SPM Measuring Modes

Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional)

Spectroscopy Modes

Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy

Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes

Tip-EnhancedPhotoluminescence (TEPL)

Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)

Conductive AFM Unit (optional)

Current range:  100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA and 10 µA) switchable from the software

Optical Access

Capability to use simultaneously top and side plan apochromat objective: Up to 100x, NA = 0.7 from top or side; Up to 20x and 100x simultaneously

Closed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment: Range 20 µm x 20 µm x 15 µm; Resolution: 1 nm

Spectrometer

Fully automated XploRA Plus compact micro-spectrometers, functional as stand-alone micro-Raman microscope

Wavelength range: 75 cm-1 to 4000 cm-1 

Gratings: 4 gratings on computer controlled turret (600, 1200, 1800 and 2400 g/mm)

Automation: Fully motorized, software controlled operation

Detection

Full range of CCD detectors and EMCCDs.

Laser Sources

Typical wavelength: 532 nm, 638 nm, 785 nm. Other wavelengths available on request.

Automation: Fully motorized, software controlled operation

Software

Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search functionalities.

Characterization of Carbon Nanotubes Using Tip-Enhanced Raman Spectroscopy (TERS)
Characterization of Carbon Nanotubes Using Tip-Enhanced Raman Spectroscopy (TERS)
The use of TERS to reveal the defects density in the structure of CNTs is of interest for a better understanding of the electrical properties of the devices made with such nano-objects. Not only defects concentration but also local chirality changes from the different radial breathing modes, pressure effect and strain distribution can be studied at the single carbon nanotube level through TERS.
Characterization of Graphene using TERS
Characterization of Graphene using TERS
Characterization of MoS2 Flakes using TEOS
Characterization of MoS2 Flakes using TEOS
Both TEPL and TERS images are well correlated with AFM morphological images obtained simultaneously, and all are consistent in revealing the nature (number of layers) of MoS2 flakes. Upon deconvolution, the TEPL signal is even capable of revealing local inhomogeneities within a MoS2 flake of 100 nm size. Kelvin probe measurement supports TEPL and TERS measurements and adds to the power of such tip-enhanced combinative tools. TEOS characterization of 2D materials is likely to contribute to further deployment of these materials into commercial products through a better understanding of their electrical and chemical properties at the nanoscale.
NanoRaman Brochure
CategoryDocuments
Size 6.49 MB
FiletypePDF
OMNI TERS Probes
CategoryDocuments
Size 1 MB
FiletypePDF

REQUEST FOR INFORMATION

Do you have any questions or requests? Use this form to contact our specialists.

Related products

AFM-Raman - LabRAM Nano
MoreAFM-Raman - LabRAM Nano
Physical and Chemical imaging
Raman Spectrometer - LabRAM HR Evolution
MoreRaman Spectrometer - LabRAM HR Evolution
Confocal Raman Microscope
Raman Spectrometer - LabRAM Odyssey
MoreRaman Spectrometer - LabRAM Odyssey
Best-in-class Raman Imaging & High Resolution Spectrometer
Raman Spectrometer - XploRA™ PLUS
MoreRaman Spectrometer - XploRA™ PLUS
Confocal Raman Microscope
AFM-Raman - LabRAM Nano
MoreAFM-Raman - LabRAM Nano
Physical and Chemical imaging
Auto SE Accessories
MoreAuto SE Accessories
Customize your instrument
Auto Soft
MoreAuto Soft
Intuitive Auto-Soft Interface for the Auto SE and Smart SE
Customize with VBS
MoreCustomize with VBS
Scripts and ActiveX
DeltaPsi2 Software
MoreDeltaPsi2 Software
A Platform for HORIBA Scientific Ellipsometers
Glow Discharge Optical Emission Spectrometer - GD-Profiler 2™
MoreGlow Discharge Optical Emission Spectrometer - GD-Profiler 2™
Discover a Whole New World of Information
Gratings - OEM Diffraction Grating
MoreGratings - OEM Diffraction Grating
Instant Processing
MoreInstant Processing
On-the-fly custom data processing
LabSpec 6: Validated performance
MoreLabSpec 6: Validated performance
LabSpec 6 is a validated software
Multivariate Analysis
MoreMultivariate Analysis
Data analysis for complex data sets
OneClick
MoreOneClick
Fast and easy Raman acquisition
Particle Finder
MoreParticle Finder
PP-TOFMS Software
MorePP-TOFMS Software
Egonomic software for data acquisition, data treatment and technical support
Raman Spectral Libraries
MoreRaman Spectral Libraries
For data searching
Raman Spectrometer - LabRAM HR Evolution
MoreRaman Spectrometer - LabRAM HR Evolution
Confocal Raman Microscope
Raman Spectrometer - Modular Systems
MoreRaman Spectrometer - Modular Systems
Fiber coupled microscope
Raman Spectrometer - XploRA ONE™
MoreRaman Spectrometer - XploRA ONE™
Simply better Raman
Raman Spectrometer - XploRA™ PLUS
MoreRaman Spectrometer - XploRA™ PLUS
Confocal Raman Microscope
Spectral Database Searching
MoreSpectral Database Searching
1750 Raman spectra availabale
Spectroscopic Ellipsometer - Large area mapping Ellipsometers
MoreSpectroscopic Ellipsometer - Large area mapping Ellipsometers
For Flat Panel Display and Photovoltaic Industries
Spectroscopic Ellipsometer - UVISEL 2
MoreSpectroscopic Ellipsometer - UVISEL 2
Scientific Spectroscopic Ellipsometer Platform
Spectroscopic Ellipsometer - UVISEL Plus In-Situ
MoreSpectroscopic Ellipsometer - UVISEL Plus In-Situ
In-situ spectroscopic ellipsometer for real-time thin film monitoring
Spectroscopic Ellipsometer Options and Accessories
MoreSpectroscopic Ellipsometer Options and Accessories
SPRi - OpenPleX
MoreSPRi - OpenPleX
Manual label-free molecular interaction analysis machine Flexible Research Platform
Template and Methods
MoreTemplate and Methods
Recall settings, and automate processes
User Accounts
MoreUser Accounts
Password protected user access control
Video Overlay
MoreVideo Overlay
XGT-7200
MoreXGT-7200
X-ray Analytical Microscope
AFM-Raman - LabRAM Nano
MoreAFM-Raman - LabRAM Nano
Physical and Chemical imaging
Raman Spectrometer - LabRAM Odyssey
MoreRaman Spectrometer - LabRAM Odyssey
Best-in-class Raman Imaging & High Resolution Spectrometer