RF-Only generator is Class E standard and optimized for stability and crater shape allowing for real surface analysis.
Source can be pulsed with synchronized acquisition for optimum results on fragile samples. The use of an RF source allows analysis of conventional and non conventional layers and materials.
Simultaneous optic provides full spectral coverage from 110 to 800nm, including deep UV access to analyze H, O, C, N and Cl.
- HORIBA original, ion-etched holographic gratings assure the highest light throughput and resolution for maximum light efficiency and sensitivity.
Patented HDD detection provides speed and sensitivity in detection without compromise.
- On line measurement of crater depth and erosion rate with patented built in Interferometer. DIP.
Easily accessible sample compartment allows plenty of room for sample loading.
Powerful QUANTUM™ software with Tabler report writing tool.
CenterLite laser pointer (patent pending) for precise sample loading.
Monochromator option available only from HORIBA provides the perfect tool to increase instrument flexibility while adding "n+1" capability.