Spectroscopic Ellipsometers
Surface characterization instruments measure physical, mechanical and chemical parameters of an interface such as thin films and coatings. These instruments are used to measure optical properties, film thickness, composition, morphology and other parameters related to surface analysis.
HORIBA provides a wide range of surface characterization instruments including:
These instruments are used over a broad range of market such as:
Spectroscopic Ellipsometer for Simple Thin Film Measurement
AFM and inverted light microscopy
Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer
High efficiency dedicated process Raman spectrometer for rugged and robust Raman monitoring.
Confocal Raman Microscope
AFM-Raman for physical and chemical imaging
Best-in-class Raman Imaging & High Resolution Spectrometer
Raman Microscope
Real-time and Direct Correlative Nanoscopy
Affordable Benchtop Raman Spectrometer
The AFM optical platform
Ultra-Fast, Sensitive and High Resolution Depth Profiling technique
Scanning NV Magnetometry
Raman Spectrometers
Fiber coupled microscope
Powerful and Cost Effective Spectroscopic Ellipsometer
Advanced stand-alone AFM
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
Versatile AFM Optical Coupling
for UV Raman spectroscopists
A versatile spectroscopic ellipsometer covering a large range from VUV to NIR
Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm
In-situ spectroscopic ellipsometer for real-time thin film monitoring
Inverted Raman Microscope
AFM-Raman for Physical and Chemical imaging
Raman Spectrometer - Confocal Raman Microscope
