Spectroscopic Ellipsometers
Surface characterization instruments measure physical, mechanical and chemical parameters of an interface such as thin films and coatings. These instruments are used to measure optical properties, film thickness, composition, morphology and other parameters related to surface analysis.
HORIBA provides a wide range of surface characterization instruments including:
These instruments are used over a broad range of market such as:
Spectroscopic Ellipsometer for Simple Thin Film Measurement
Powerful and Cost Effective Spectroscopic Ellipsometer
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
A versatile spectroscopic ellipsometer covering a large range from VUV to NIR
Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm
In-situ spectroscopic ellipsometer for real-time thin film monitoring
