Training course

Training

AFM-Raman

Overview

  • Reference: RAM4
  • Dates:
    • May 11-13, 2020
    • November 16-18, 2020
  • Who should attend: Scientists, engineers, technicians, Ph.D. students who have already acquired good skills in Raman spectroscopy or SPM.
  • Duration: 3 days (From 9 am to 5:30 pm)

Objectives

  • Acquire practical knowledge on Raman spectroscopy and Scanning probe microscopy
  • Learn how to use dedicated Raman and AFM software
  • Learn the methodology to perform TERS measurements (alignment, macros, procedures)

Program

Day 1

Raman spectroscopy

  • Basic principle and advantages of raman spectroscopy
  • Instrumentation
     

Practical session

  • Optimization of the parameters: How to choose the laser, the grating, the confocal hole, the laser power
  • How to make a Raman image (2D)
  • Data evaluation: cursors, CLS fitting, peak fitting
  • Fast mapping using SWIFT XS

Objective: Being able to select the good parameters for Raman imaging and to perform data process

Scanning Probe Microscopy (SPM)

  • Instrumentation
  • The different modes (AFM, STM, Tuning Fork) and signals (Topography, Phase, KPFM, C-AFM, MFM, PFM)
     

Practical session

  • Tips and sample installation
  • Molecular resolution in AFM tapping mode
  • Measurements in AC mode, contact mode, I-top mode, KPFM
  • Presentation of the dedicated tips and additional equipment

Objective: Being able to use the main AFM modes and optimize the parameters

Day 2

Tip Enhanced Raman Spectroscopy

  • Principle and requirements
  • Presentation of the different TERS tips (STM-TERS Au, AFM-TERS Au and AFM-TERS Ag)
  • Excitation laser alignment on the TERS tip (rough and fine alignment)
  • TERS demonstration on carbon nanotubes and graphene oxide flakes
  • Optimization of the TERS parameters (spectra and imaging)
     

Practical session

  • Hands-on on demo samples (AFM mode)
  •  Laser alignment on the tip
  • TERS spectra and TERS imaging on known sample

Day 3

TERS Hands-on

  •  TERS measurements, from AFM-TERS tip installation to TERS mapping.
  •  TERS measurements on end users samples.
  • Bring your own samples!

Our trainers are experts in each technique. They will provide trainings advice and guidance to make the most of your HORIBA Scientific instrument. You will gain confidence and experience in the analysis of your samples.

Certificates are given to every attendee for every course.

All trainings are held in France or at your location and are conducted in  French or English.

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