Program
Day 1
Raman spectroscopy
- Basic principle and advantages of raman spectroscopy
- Instrumentation
Practical session
- Optimization of the parameters: How to choose the
- laser, the grating, the confocal hole, the laser power
- How to make a Raman image (2D)
- Data evaluation: cursors, CLS fitting, peak fitting
- Fast mapping using SWIFT XS
Objective: Being able to select the good parameters for
Raman imaging and to perform data process
Scanning Probe Microscopy (SPM)
- Instrumentation
- The different modes (AFM, STM, Tuning Fork) and signals (Topography, Phase, KPFM, C-AFM, MFM,PFM)
Practical session
- Tips and sample installation
- Molecular resolution in AFM tapping mode
- Measurements in AC mode, contact mode, I-top mode,
KPFM - Presentation of the dedicated tips and additional
equipment
Objective: Being able to use the main AFM modes and optimize the parameters
Day 2
Tip Enhanced Raman Spectroscopy
- Principle and requirements
- Presentation of the different TERS tips (STM-TERS Au,
AFM-TERS Au and AFM-TERS Ag) - Excitation laser alignment on the TERS tip (rough and
fine alignment) - TERS demonstration on carbon nanotubes and
graphene oxide flakes - Optimization of the TERS parameters (spectra and
imaging)
Practical session
- Hands-on on demo samples (AFM mode)
- Laser alignment on the tip
- TERS spectra and TERS imaging on known sample
Day 3
TERS Hands-on
- TERS measurements, from AFM-TERS tip installation to TERS mapping.
- TERS measurements on end users samples.
