Spectroscopic Ellipsometry

Material Characterization

Dynamic Image Analysis Technology

Image analysis encompasses any technology which involves the processing of captured images. For the purposes of particle characterization, the major division is between static image analysis and dynamic image analysis. The distinction is whether particles are presented in a static (stationary) orientation or dynamic, flowing past the detector.

Dynamic Light Scattering (DLS) Particle Size Distribution Analysis

Particle size can be determined by measuring the random changes in the intensity of light scattered from a suspension or solution. This technique is commonly known as dynamic light scattering (DLS), but is also called photon correlation spectroscopy (PCS) and quasi-elastic light scattering (QELS). The latter terms are more common in older literature.

Spectroscopic Ellipsometry

Ex-situ spectroscopic ellipsometry.

Spectroscopic ellipsometry is a non-destructive, noncontact, and non-invasive optical technique which is based on the change in the polarization state of light as it is reflected obliquely from a thin film sample. 

Static Light Scattering (SLS)/Laser Diffraction Particle Size Distribution Analysis

Light scattering has long been used to investigate the size of various objects. Gustav Mie (he of the Mie Scattering Theory) studied gold nanoparticles like those in the image below as part of his doctoral thesis.

Molecular Weight Technology

The SZ-100 Nanoparticle Analyzer can be used in to measure the molecular weight of proteins, starches, polymers, and dendrimers. This data can be obtained by two different methods, dynamic light scattering and static light scattering. These methods are discussed below.

Surface Area Analysis

The specific surface area and the pore size distribution are fundamental parameters for the characterization of solids. Properties such as porosity, strength, hardness, etc. can be directly correlated to the porous structure of a material. These properties can be easily investigated by the SA-9600 surface area analyzer.

Zeta Potential

Zeta potential is the charge on a particle at the shear plane. This value of surface charge is useful for understanding and predicting interactions between particles in suspension.

Fluid Measurements and Control

A mass flow controller automatically controls the flow rate of a gas according to a set flow rate sent as an electric signal, without being affected by use conditions or changes in gas pressure.