Surface Science

Cathodoluminescence Spectroscopy

Phosphor image

Bombarding the surface of a material with some particle or radiation may produce the emission of electromagnetic radiation. This emission can be in the wide spectral range from ultraviolet up to infrared. This general phenomenon is known as luminescence.



Raman and AFM (Atomic Force Microscope) analysis can be combined on a single microscope system, opening interesting new capabilities and providing enhanced information on sample composition and structure by collecting physical and chemical information on the same sample area. Co-localized AFM/Raman measurement is the sequential or simultaneous acquisition of overlapped SPM (Scanning Probe Microscope) and Raman maps with pixel-to-pixel correspondence in the images.

Glow Discharge Optical Emission Spectroscopy

Thin and Thick films analysis. Pulsed RF Glow Discharge Spectrometers - Ultra Fast Elemental Depth Profiling

HORIBA Scientific Pulsed RF Glow Discharge Spectrometers are used in universities where they contribute to the development of new materials with coatings at nano-scale and upward and in industries to monitor photovoltaic devices manufacturing, to understand the origin of corrosion on painted car bodies, to assess the composition of precious metals, to control hard disks or LED manufacturing, to improve Li batteries, etc.