Semiconductors

Carrier Lifetime Analysis for Semiconductor Raw Materials

Deposition of highly crystalline SiC epitaxial films is essential for high-performance compound semiconductors, and we will introduce a non-destructive and precise method for analyzing crystallinity after deposition.

SiC carrier lifetime analysis
- Carrier lifetime analysis of different SiC film formation conditions by PL lifetime measurement

Fluorescence lifetime measurement device DeltaFlex

Observe differences in carrier life by measuring PL life
Diverse light source wavelength repertoire
Supports a wide range of PL life from picoseconds to several seconds

DeltaFlex

TCSPC/MCS Fluorescence Lifetime System

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Fluorescence Lifetime

Dedicated time-resolved fluorescence systems incorporating TCSPC detection, electronics, and lasers for materials or life science sample analysis from macro to confocal FLIM microscopy.

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