• Skip to navigation
  • Skip to content
  • Accueil
  • à propos d’HORIBA
  • Investor Relations
  • Actualités
  • Publications
  • Responsabilités sociales
  • Emplois
  • Contact Us
HORIBA
Country/Region Selection
France
Site search
  • Tests Moteurs Systèmes
  • Process et environnement
  • Médical
  • Semi-conducteurs
  • Scientifique
  • Recherche de Produits
  • Products
  • Process Control
  • News & Events
  • About Us
  • Contact Us
  • Product Lines
  • Processes
  • Measuring Object
  • Measurement Method
    • Absorption spectroscopic method
    • Glass electrode method
    • Conductivity measurement and
      concentration conversion
    • Electromagnetic induction method
    • Fluoride ion electrode method
    • 2-electrode method
    • 4-electrode method
    • Laser scattering method
    • Molybdenum blue method and
      absorptiometric method
    • Blowing method
    • CRDS
    • NDIR
    • Spectroscopic ellipsometry
    • Optical interferometric method
    • Plasma emission analysis method
    • Quadrupole mass spectrometry
    • Mass flow measurement
      Differential pressure detection method
    • Mass flow measurement
      Thermal sensor method
    • Soap film detection method
  • Product Name
Sommaire » Semi-conducteurs Products Measurement Method NDIR

NDIR

Vapor Concentration Monitor IR-300

Vapor Concentration Monitor IR-300

In-line compact vapor concentration monitor, enables MOCVD precursor delivery to be stable.

© 1996-2020 HORIBA, Ltd. All rights reserved.
  • Infos légales
  • Données Personnelles
  • Cookies
  • Accessibilité
  • Plan du site
  • Recherche