CIGS (CuIn1-xGaxSe2) thin films characterization

by Spectroscopic Ellipsometry

CIGS is one of the most efficient solar cell absorbers and used in a number of solar cell structures. Consequently, non-destructive characterisation of the material is very important. Spectroscopic ellipsometry is a technique perfectly adapted for such task: it is fast, non-contact and can be realized in a real fab environment. The challenge for such characterisation is the accurate determination of the optical functions of CIGS and this is essentially related to the large surface roughness always present, whatever the deposition method. This application note presents a convenient approach to the ellipsometric characterisation of CIGS, using an optimised surface etch method tailored to minimize the errors in optical properties determination induced by surface roughness.

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