Semiconductor Page Heading

Material Characterization

Measuring techniques are necessary for the analysis and development of next-generation materials. HORIBA supports your new material development and quality control with specialized measuring techniques.

Overview of All Material Interests:

Film thickness
  • Spectroscopic Ellipsometry
  • Reflectometry
  • X-Ray Fluorescence
  • GD-OES/

 

 

 Optical Constants
  • Spectroscopic Ellipsometry
  • Reflectometry
   Band gap
  • Spectroscopic Ellipsometry
  • Photoluminescence
  • Fluorescence
Roughness
  • Spectroscopic Ellipsometry
  • AFM
  • Raman-AFM
   Crystallinity
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Raman-AFM
   Stoichiometry
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Raman-AFM
  • AFM
Stress/Strain
  • Raman Spectroscopy
  • Cathodoluminescence
   Defect Analysis
  • Raman Spectroscopy
  • Photoluminescence
  • Cathodoluminescence
  • X-Ray Fluorescence
  • AFM
  • Raman-AFM
   Impurity Analysis
  • Raman Spectroscopy
  • Raman-AFM
  • Photoluminescence
  • Cathodoluminescence
  • X-Ray Fluorescence
  • GD-OES
  • PP-TOFMS
  • Instrumental Gas Analyzers
Doping Concentration
  • Photoluminescence
  • PP-TOFMS
   Carrier Concentration
  • Photoluminescence
  • Instrumental Gas Analyzers
  • GD-OES
  • AFM
  • Raman-AFM
   Elemental Composition
  • X-Ray Fluorescence GD-OES
  • PP-TOFMS
  • Instrumental Gas Analyzers
Chemical Identification
  • Raman Spectroscopy
  • Raman-AFM
   Chemical Concentration
  • Raman Spectroscopy
  • Chemical Concentration Monitors
   Carrier Lifetime
  • Fluorescence
Surface Potential
  • AFM
  • Raman-AFM
   Layers of 2D Materials
  • Spectroscopic Ellipsometry
  • Raman Spectroscopy
  • Photoluminescence
  • AFM
  • Raman-AFM
   Electrical Properties
  • AFM
  • Raman-AFM
Particle Analysis
  • Particle size analyzers
        

 

Film Thickness

Band Gap

Stress / Strain

Defect Analysis

Elemental Composition

Chemical Identification

Carrier Lifetime

Layers of 2D Materials

Particle Analysis

Corporate