Correlated TERS, TEPL and SPM Measurements of 2D Materials

Nano-characterization of Transition Metal Dichalcogenides

Correlated TERS, TEPL and SPM Measurements of 2D Materials

This application note reports on nano-characterization with AFM-Raman of 2D transition metal dichalcogenides (TMDCs) materials which are considered of very high potential semiconductors for future nanosized electronic and optoelectronic devices. Scanning probe microscopy giving access to the critical topographic and electronic properties at the nanoscale is coupled to photoluminescence (PL) and Raman spectroscopies by means of plasmon enhancement to yield correlated electrical and chemical information down to the nanoscale.

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