In this technical note we present the features of the XGT-9000, the new X-ray microscope from HORIBA. We show its versatility through some examples of the application domains which could benefit from a micro X-ray fluorescence analysis.

The evolution of μXRF! Combination of improved sensitivity and new imaging technology achieved high speed analysis of foreign materials in only one unit.

μ-XRF is one of the powerful non-destructive analytical technique in forensic science application. Thanks to the elemental mapping and the spectrum search function, XGT-9000 enables to reveal intentional alternation and identify the ink used on a document.

μ-XRF is a non-destructive analytical technique which can inspect defects, even non-visible ones, inside a sample because of the high penetration of X-rays. This application note introduces failure analysis to detect ion migration, voids, and foreign matter on electronics using the XGT-9000, with key features of the vertical irradiation of a 10 μm probe and the simultaneous imaging of fluorescent X-rays and transmission X-rays.

Spectroscopic analysis can reveal the origin of cultural heritages and the historical background at the time. This application note introduces research of a dragonfly eye bead found in a tomb in China. Using Raman spectroscopy and X-ray analytical microscopy, the bead was found to be from the Eastern Mediterranean region and the result suggested China had cultural and economic exchanges with them during that era.