Understanding material composition is essential for quality control, compliance, and innovation. HORIBA’s elemental analysis solutions offer precise and dependable information on material composition, benefiting industries such as automotive, aerospace, electronics, and environmental sciences.
From detecting impurities to optimizing processes, our technologies empower you to meet regulatory standards, improve performance, and drive discoveries. HORIBA, with years of experience and worldwide assistance, is the reliable ally in uncovering hidden aspects and maximizing the capabilities of your materials and procedures.
Together, we illuminate the unseen.
HORIBA's in-line XRF monitoring system is designed for real-time analysis and control in roll-to-roll coating processes. This technology allows for precise measurement of material thickness and element concentration directly during production, eliminating the need for time-consuming laboratory analysis. It integrates seamlessly into existing systems, supports standard communication protocols, and helps optimize the use of precious metals, reduce waste, and enhance production efficiency.
Inline XRF technology offers significant advantages in measuring noble elements such as platinum, iridium and others, which is particularly employed in the production of fuel cell membranes. For instance, it allows for real-time, non-destructive analysis of platinum content, ensuring precise control over the amount of metal used. This not only enhances the quality and efficiency of the fuel cells but also reduces material costs by optimizing the use of this precious metal.
HORIBA provides advanced solutions for elemental analysis, catering to industries such as environmental monitoring, metallurgy, and advanced materials.
With innovative technologies like ICP-OES, RF Glow Discharge Spectroscopy, Carbon/Sulfur and Oxygen/Nitrogen/ Hydrogen Analyzers, and XRF systems, HORIBA ensures precision and efficiency.
Instruments like the Ultima Expert and GD-Profiler 2™ address specific challenges in trace element detection, depth-resolved analysis, and material integrity. Instruments like the EMIA Expert and EMGA Expert are cost effective for C/S and O/N/H analysis. By enabling compliance with standards and delivering reliable data, HORIBA supports industries in achieving analytical excellence.
Explore their product line to transform elemental analysis into a streamlined, impactful process.
The EPI team of Lavoisier de Versailles Institute (ILV, UMR CNRS-UVSQ 8180) carries out fundamental and applicative research activities relying on electrochemistry and electron spectroscopies to deeply investigate the physico-chemistry of surfaces and interfaces of materials and devices finding applications in various fields such as micro or opto-electronic, photovoltaic and cultural heritage.
EPI team has a large collaborative network with academic and industrial partners, among them IPVF (Institut Photovoltaïque d’Ile de France) since 2014, and oversees the chemical characterisation of the layers (absorbers, ETL, HTL, passivation…) and of the cells they elaborate.
M. Bouttemy, Reseach Engineer, Institut Lavoisier de Versailles, Versailles, France
In particular, EPI has developed in collaboration with HORIBA a specific methodology to address the problematic of buried interfaces characterization in solar cells by coupling GDOES and XPS. The GDOES enables to quickly reach interfaces of interest, while monitoring the layers crossed, and creates a crater large enough to directly perform XPS inside and continue by performing XPS depth profiling.
The XPS provides precise chemistry information to control quality and properties of interfaces and optimize the manufacturing process of the cells to achieve increased performance and better reliability.
D. Mercier, M. Bouttemy, J. Vigneron, P. Chapon, A. Etcheberry, “GD-OES and XPS coupling: A new way for the chemical profiling of photovoltaic absorbers”, Applied Surface Science 347 (2015) 799–807.
Prevent, Protect, Perfect with Advanced Analytical Solutions for Corrosion
Webinar presented by Alice Stankova, ICP-OES Product Manager, HORIBA France SAS, and Patrick Chapon, GDOES Product Manager, HORIBA France SAS on Tuesday, March 11th, at 2:00 PM (GMT); 3:00 PM (CET)
For corrosion purposes, different advanced analytical solutions are needed to predict failures, optimize material lifespan, and ensure durability and reliability of protection strategies in demanding environments.
This webinar presents a comprehensive range of advanced analytical solutions for the corrosion market, designed to address the complexities of corrosion processes and protection strategies.
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