Semiconductors

Stress imaging of Si microfabricated structures

Stress distribution analysis using Raman images

3D imaging revealed mechanical stress acting in shallow trenches at the edge of the active zone.

There is a linear correlation between the stress applied to Si and the Raman peak shift.

^{_{M.Komatsubara,T.Namzu,Y.Nagai,S.Inoue,N.Naka,S.Kashiwagi,K.Ohtsuki :Jph.J.Appl.phys.48(2009)04C021}}

Microscopic Raman spectrometer LabRAM Odyssey

Industry's highest level* stress resolution (*according to our research in 2022)
Capable of mapping up to 12 inch wafers
Temperature control holder can be used (please consult us separately regarding sample size)

AFM (atomic force microscope) Raman XploRA Nano

Acquire physical information by AFM and chemical information by Raman simultaneously
Stress distribution analysis on the outermost surface on the order of nm is possible.

LabRAM Odyssey

Confocal Raman & High-Resolution Spectrometer

XploRA Nano

AFM-Raman for Physical and Chemical imaging

» Link to Raman Imaging and Spectrometers
» Link to AFM Optical Platform

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