Scientific

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Scientific

Surface Characterization

Surface characterization instruments measure physical, mechanical and chemical parameters of an interface such as thin films and coatings. These instruments are used to measure optical properties, film thickness, composition, morphology and other parameters related to surface analysis.

HORIBA provides a wide range of surface characterization instruments including:

 

These instruments are used over a broad range of market such as:

  • Material Sciences for nanomaterials, graphene, quantum dots
  • Semiconductor for display technology, light emitting diodes, data storage
  • Energy for battery, photovoltaics cells

Spectroscopic Ellipsometers

Glow Discharge Optical Emission Spectrometers

Plasma Profiling Time-Of-Flight Mass Spectrometers

 

 

Atomic Force Microscopes

Raman Spectrometers

Browse Products

Auto SE
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Spectroscopic Ellipsometer for Simple Thin Film Measurement

CombiScope
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AFM and inverted light microscopy

GD-Profiler 2™
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Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer

HE Spectrograph
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High efficiency dedicated process Raman spectrometer for rugged and robust Raman monitoring.

LabRAM HR Evolution
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Confocal Raman Microscope

LabRAM Nano
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AFM-Raman for physical and chemical imaging

LabRAM Odyssey
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Best-in-class Raman Imaging & High Resolution Spectrometer

LabRAM Soleil
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Raman Microscope

LabRAM Soleil Nano
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Real-time and Direct Correlative Nanoscopy

MacroRAM™
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Affordable Benchtop Raman Spectrometer

OmegaScope
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The AFM optical platform

Plasma Profiling TOFMS
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Ultra-Fast, Sensitive and High Resolution Depth Profiling technique

ProteusQ
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Scanning NV Magnetometry

Raman Fiber Probes
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Raman Spectrometers

Smart SE
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Powerful and Cost Effective Spectroscopic Ellipsometer

SmartSPM
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Advanced stand-alone AFM

Spectroscopic Ellipsometer - In-Line
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In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

TRIOS
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Versatile AFM Optical Coupling

UV Raman Spectrometer
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for UV Raman spectroscopists

UVISEL 2 VUV
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A versatile spectroscopic ellipsometer covering a large range from VUV to NIR

UVISEL Plus
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Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm

UVISEL Plus In-Situ
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In-situ spectroscopic ellipsometer for real-time thin film monitoring

XploRA INV
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Inverted Raman Microscope

XploRA Nano
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AFM-Raman for Physical and Chemical imaging

XploRA™ PLUS
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Raman Spectrometer - Confocal Raman Microscope