Measuring techniques are necessary for the analysis and development of next-generation materials. HORIBA supports your new material development and quality control with specialized measuring techniques.
Cathodoluminescence Solutions for Electron Microscopy
Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer
Confocal Raman Microscope
Laser Scattering Particle Size Distribution Analyzer
In-situ spectroscopic ellipsometer for real-time thin film monitoring
X-ray Analytical Microscope (Micro-XRF)
AFM-Raman for Physical and Chemical imaging
Ultra-Fast, Sensitive and High Resolution Depth Profiling technique
