Application
Material & Property Characterization
MR-VS series are new special instruments for spectrum measurement which employ compact spectrograph and optical fiber.
Easy measurement of cathodoluminescence spectrograph by mounting to SEM.
The compact LA-350 uses Mie scattering (laser diffraction) to measure particle size quickly and easily. The speed and ease of this technique makes it popular for most particle sizing applications
Silicon crystal is widely used in semiconductors. The PHOTOLUMINOR-D has been designed especially for quantitative impurity analysis of silicon crystals with high sensitivity.
The application of photoluminescence for the quality...
The PHOTOLUMINOR-S has been designed for R&D in many applications and provides high performance and easy operation. High-sensitivity measurement is important for detecting weak photoluminescence...
The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high resolution camera creates an intuitive, easy-to-use imaging workstation.
Achieves dramatic cost reductions in advanced mask inspections
SC-FM2 UNIQUE High Resolution Option with modified 35mm camera with intensifier attachment on Top (in place of prism), UV Quartz optics. Ability to mount the 78mm lens on FM Nikon camera and view live the UV image in the...
The SceneScope imager uses intensified UV reflectance instead of fluorescence as in Forensic Light Sources.
The SpectrAcq2 is not just another readout system - it's a compact, high speed, high performance spectral data acquisition controller designed for advanced spectroscopy and light measurement applications.