Micro Analysis

MP-32S/M requires SEM as excitation source and it can evaluate defects, impurities and crystalline construction in micro region.

A range of fiber optic coupled Raman probe heads for remote analysis. Suitable for immersion and high temperature/pressure conditions.

SEM and Optical Microscopes are important instruments for the research, development and Q/C of materials. Up to now, the preparation needed to get a true sample surface requires high-level technical know-how and many hours.

By using TENSEC, anyone can prepare a surface in just 10 seconds (the World’s first).

XelPleX is the ideal solution for label-free and multiplexed molecular interaction analysis.

Single point analysis and automated hyperspectral imaging.

Dual vacuum modes.

Spot sizes from 1.2 mm to 10 µm.