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Manufacturing
MP-32S/M requires SEM as excitation source and it can evaluate defects, impurities and crystalline construction in micro region.
MR-VS series are new special instruments for spectrum measurement which employ compact spectrograph and optical fiber.
Easy measurement of cathodoluminescence spectrograph by mounting to SEM.
The best-selling digital mass flow controller offering multi range/multi gas solutions. High accuracy, fast response, and compact size. All metal.
Endpoint controller for plasma etch cluster tools: Simultaneous Real Time Multi-Chamber - Multi diagnosis monitor
Optimized for near-IR emissions of nanotubes and quantum dots, our Nanolog® offers the ultimate in research-grade spectroscopic measurements and accessories, and takes full excitation-emission matrix scans in seconds. Included is our unique software for classifying SWNTs and performing energy-transfer calculations.
The compact LA-350 uses Mie scattering (laser diffraction) to measure particle size quickly and easily. The speed and ease of this technique makes it popular for most particle sizing applications
Silicon crystal is widely used in semiconductors. The PHOTOLUMINOR-D has been designed especially for quantitative impurity analysis of silicon crystals with high sensitivity.
The application of photoluminescence for the quality...
The PHOTOLUMINOR-S has been designed for R&D in many applications and provides high performance and easy operation. High-sensitivity measurement is important for detecting weak photoluminescence...
Achieves dramatic cost reductions in advanced mask inspections
