Training

  • Reference: RAM4
  • Dates:

    • February 12-14, 2018
    • May 14-16, 2018
    • November 19-21, 2018

  • Who should attend: Scientists, engineers, technicians, Ph.D. students who have already acquired good skills in Raman spectroscopy or SPM.
  • Duration: 3 days (From 9 am to 5:30 pm)

  • Acquire practical knowledge on Raman spectroscopy and Scanning probe microscopy
  • Learn how to use dedicated Raman and AFM software
  • Learn the methodology to perform TERS measurements (alignment, macros, procedures)

Day 1

Raman spectroscopy

  • Principle and advantages of raman spectroscopy
  • Instrumentation

Practical session

  • Optimization of the parameters: How to choose the laser, the grating, the confocal hole, the laser power
  • How to make a Raman image (2D)
  • Data evaluation: cursors, CLS fitting, peak fitting
  • Fast mapping using SWIFT XS
  • Objective:  Being able to select the good parameters for Raman imaging and to perform data process

Scanning Probe Microscopy (SPM)

  • Instrumentation
  • The different modes (AFM, STM, Tuning Fork) and signals (Topography, Phase, KPFM, C-AFM, MFM, PFM)

Practical session

  • Tips and sample installation
  • Molecular resolution in AFM tapping mode
  • Measurements in AC mode, contact mode, I-top mode, KPFM
  • Presentation of the dedicated tips and additional equipment
  • Objective: Being able to use the main AFM modes and optimize the parameters

Day 2

Tip Enhanced Raman Spectroscopy

  • Principle and requirements
  • Presentation of the different TERS tips (STM-TERS Au, AFM-TERS Au and AFM-TERS Ag)
  • Excitation laser alignment on the TERS tip (rough and fine alignment)
  • TERS demonstration on carbon nanotubes and graphene oxide flakes
  • Optimization of the TERS parameters (spectra and imaging)

Practical session

  • Hands-on on demo samples (AFM mode)
  • Laser alignment on the tip
  • TERS spectra and TERS imaging on known sample

Day 3

TERS Hands-on

  • TERS measurements, from AFM-TERS tip installation to TERS mapping.
  • TERS measurements on end users samples. Bring your own samples!