Let’s Go Further in Materials Characterization with Co-localisation of Raman and micro-XRF Analysis

Presented by Jocelyne Marciano & Sarah Desplanche, Application Product Specialists, HORIBA Scientific, in partnership with Spectroscopy

A single technique is not always sufficient to fully characterize a sample. Much more complete information can be obtained by combining complementary data. The critical point is to ensure that the tests are performed on exact the same area of the sample. With HORIBA co-localization technology, this is now possible.
During this webinar we will show how combining Raman and µ-XRF characterization with this co-localization tool generates valuable information for a range of applications.