X-ray Analytical Microscope Super Large Chamber Model
Excitation systemXGT-9000SL allows X-ray fluorescence analysis at the microscopic level even on a large sample by using microprobes such as <15 µm and <100 µm ultra-high intensity probes. The X-ray generator can offer high output of X-ray irradiation up to 50 kV and 1000 µA. Thus, the high performance of the excitation system provides ultimate performance and flexibility for your large sample analysis. |  |
Optical imagesCapturing clear images is critical for micro-XRF. XGT-9000SL provides two types of cameras to grasp the image of the whole sample and its details down to the microscopic level. Multiple illumination modes help to observe brilliant images, even for reflective and transparent samples. |  |
Sample chamberXGT-9000SL’s large chamber capacity (1030 mm x 950 mm x 500 mm) can accommodate a wide variety of samples from micro-size fragments to samples as large as electronic circuit boards and paintings. XGT-9000SL is equipped with X-ray shields complying with JAIMAS0101-2001/IEC1010-1, which protect you from X-ray exposure. XGT-9000SL can allow sample analysis without destructive sample preparation or compromising your safety. |  |
DetectorsXGT-9000SL provides both a transmission X-ray detector and a fluorescent X-ray detector. The transmission X-ray detector enables users to detect internal defects and foreign matter of a sample. The fluorescent X-ray detector can detect from Americium down to carbon, with a light elements detector and He-purge module. |  |
Software suiteXGT-9000SL software, of course, covers all basic measurements such as single spot analysis, multiple spot analysis, line analysis, and map imaging. Apart from the standard software functions, advanced modules can be added to the software suite to provide more comprehensive user experiences. These include:
|
|
Click here for more details
Basic information | |
|---|---|
| Instrument | X-ray fluorescence analytical microscope |
| Sample type | Solids, Liquids, Particles |
| Detectable elements | C* – Am with optional light elements detector F* – Am with standard detector *He purge condition is necessary to detect down to carbon and fluorine for both detectors |
| Available chamber size | 1030(W) x 950(D) x 500(H) |
| Maximum sample size | 500(W) x 500(D) x 500(H) |
| Maximum mass of sample | 10 kg |
| Optical observation | Two high resolution cameras with objective lens |
| Optical design | Vertical-Coaxial X-ray and Optical observation |
| Sample illumination/observation | Top, Bottom, Side illuminations/Bright and Dark fields |
X-ray tube | |
|---|---|
| Power | 50 W |
| Voltage | Up to 50 kV |
| Current | Up to 1 mA |
| Target material | Rh |
X-ray optics | |
|---|---|
| Number of probes | Up to 4 |
| Primary X-ray filters for spectrum optimization | 5 positions |
Detectors | |
|---|---|
| X-ray Fluorescence detector | Silicon Drift Detector (SDD) |
| Transmission detector | NaI(Tl) |
Mapping analysis | |
|---|---|
| Mapping area | 350 mm x 350 mm |
| Step size | 4 mm |
Operating mode | |
|---|---|
| Sample environment | Partial vacuum / Ambient condition / He purged condition (optional)* *He purge condition is necessary to detect down to carbon and fluorine for both detectors. |
Do you have any questions or requests? Use this form to contact our specialists. * These fields are mandatory.
X-ray Analytical Microscope (Micro-XRF)
Air Pollution Monitor
Ambient Dust Monitor
Ambient Dust Monitor
Ambient Air Quality Monitoring System
Spectroscopic Ellipsometer for Simple Thin Film Measurement
Customize your instrument
Intuitive Auto-Soft Interface for the Auto SE and Smart SE
Hybrid Chemical and Video Image Display
A Platform for HORIBA Scientific Ellipsometers
Automated DLC Coating Analysis
Optimized Analytical Workflow
Discover a Whole New World of Information with Glow Discharge Optical Emission Spectrometer
Accessories for samples with various shapes, sizes and properties
Quantum and Image
ICP Software
Complete your ICP-OES Spectrometer for your specific needs
Emphasize Raman and Optical Images
For your specific application
Raman Spectral Searching
Confocal Raman Microscope
AFM-Raman for physical and chemical imaging
Raman Microscope
Real-time and Direct Correlative Nanoscopy
LabSpec 6 is a validated software
Camera Endpoint Monitor based on Real Time Laser Interferometry
X-Ray Fluorescence Analyzer
X-Ray Fluorescence Analyzer
Recall settings, and automate processes
Solid Particle Counting System
Automatic Acquisition of Raman Spectra at Multiple Positions
Data analysis for complex data sets
Multivariate Analysis App for all Raman Maps
On-board Emissions Measurement System
Fast and easy Raman acquisition
Manual label-free molecular interaction analysis machine Flexible Research Platform
Measure, Indentify, and Classify Particles
Ultra-Fast, Sensitive and High Resolution Depth Profiling technique
Ergonomic software for data acquisition, data treatment and technical support
Continuous Particulate Monitor with X-ray Fluorescence
Fiber coupled microscope
Customize with VBS
Automated Silicon Stress Analysis
Powerful and Cost Effective Spectroscopic Ellipsometer
Turns Raman Imaging from Hours to Minutes
For Flat Panel Display and Photovoltaic Industries
PTFE Filter/TFH membrane
High resolution, high sensitivity and high stability ICP-OES
Affordable high performance ICP-OES
Password protected user access control
Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm
In-situ spectroscopic ellipsometer for real-time thin film monitoring
X-ray Analytical Microscope (Micro-XRF)
AFM-Raman for Physical and Chemical imaging
Raman Spectrometer - Confocal Raman Microscope
X-Ray Fluorescence Analyzer
X-Ray Fluorescence Analyzer
Measurement of Sulfur and Chlorine in Petroleum Products
X-ray Fluorescence Sulfur/Chlorine-in-oil Analyzer
Continuous Particulate Monitor with X-ray Fluorescence
X-ray Fluorescence Sulfur-in-Oil Analyzer
X-ray Fluorescence Sulfur-in-Oil Analyzers
X-ray Fluorescence Sulfur-in-Oil Analyzer
X-ray Fluorescence Sulfur-in-Oil Analyzer
Energy Dispersive X-ray Fluorescence Analyzer
X-ray Analytical Microscope (Micro-XRF)
