Featured Products

AutoSE

Visualize your sample and measure thin film thickness and optical constants in seconds.

"With Auto SE, routine work will never be the same!"

NEW NIR Extended Spectral Range !

UVISEL Plus

Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm

Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.

1000M Spectrometer

With a 1000 mm focal length, this spectrometer is ideal for applications when extremely low stray light levels are required, such as in Raman fluorescence excitation or when ultra high resolution is needed for emission structure analysis.

1250M Spectrometer

The 1250M is the spectrometer of choice for highest resolution spectroscopy whether your samples are gases, semiconductors, lasers or something else.

750M Spectrometer

The 750M delivers the resolution of a typical 1.0 metre spectrometer and the throughput of a smaller instrument in a convenient package.

APDA-371 Ambient Dust Monitor

The APDA-371 automatically measures and records airborne particulate concentration levels (in milligrams or micrograms per cubic meter) using the industry-proven principle of beta ray attenuation.

 

APHA-370 Ambient THC monitor

The APHA-370 continuously monitors atmospheric THC, NMHC, and CH4 concentrations...

APMA-370 Carbon Monoxide monitor

The APMA-370 is a device for continuously monitoring CO concentrations using a coss-modulation NDIR...

 

AutoSE

Visualize your sample and measure thin film thickness and optical constants in seconds.

"With Auto SE, routine work will never be the same!"

NEW NIR Extended Spectral Range !

Automatic COD Monitor CODA-500

CODA-500: High-Performance Automatic CODMN Monitor Created Through Advanced Technology and More Than 30 Years of Accumulated Expertise

Automatic pressure regulators

The UR series automatic pressure regulators are electronic regulators with high-precision pressure sensors and ...

BHF monitor image

The CS-137 offers reliable, unobtrusive round the clock, real-time monitoring of BHF solution concentrations primarily used for wet etching in semiconductor processes.