The UVISEL VIS spectroscopic ellipsometer covers the spectral range from 210 to 880 nm, and can be easily extended in both FUV and NIR range (see UVISEL FUV and NIR models). The measurement is performed in a few minutes and is extremely repeatable.

The UVISEL spectroscopic ellipsometer is ideally suited for research and development applications in a variety of fields, including semiconductor, displays, optical coatings, chemistry and biology.

Manufactured by HORIBA Scientific


  • Characterization of thickness and optical constants in the VIS spectral range of thin films and multilayer stacks for:
    - Dielectrics
    - Amorphous semiconductors
    - Polymers
    - Thin metal films
    - Glass

  • Material properties: graded, anisotropic, porous layers.