Characterizing semiconductor materials by optical microspectroscopies

The growing of semiconductor materials industrialization requires technologies to characterize their properties. Optical microspectroscopic platforms like Raman microscopes offer both physical and chemical information in one system. Thus, process qualification, wafer uniformity assessment, or defects inspection of wafers can be achieved with Raman microscopy. These can also be applied to new materials characterization.

In this webinar, we will highlight how Photoluminescence and Raman microscopies can address semiconductor challenges. We will also show how the combination of micro-spectroscopies with AFM (Atomic Force Microscopy) can provide nano resolution and deeper understanding of these structures.

Who should attend:

• Scientists working on semiconductor materials developments,
• Scientists looking for new methods of material characterization for semiconductors,
• Semiconductors, Photovoltaics, and 2D materials Raman users.
   

Key learning objectives:

• Understand the different challenges that Raman microscopy solves,
• Understand the capital-gain of Raman microscopy for semiconductor industry,
• Why Raman microscopy is an ideal technique for semiconductor materials characterization