Cathodoluminescence - CLUE Series

Cathodoluminescence Solutions for Electron Microscopy

HORIBA's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.

Segment: Scientific

Division: Custom Spectroscopy Solutions

Manufacturing Company: HORIBA France SAS

CLUE systems include HORIBA's MicroHR, iHR and LabRAM series spectrometers, Synapse Plus™ and Syncerity^TM CCDs and EMCCDs, Symphony^TM InGaAs arrays as well as photomultiplier tube detectors to create an unrivalled flexibility.
CLUE is also fully automated, controlled by LabSpec 6^TM simply powerful software, which experimental parameters, data-fitting, display and export. It is easy to use and offers comprehensive system control, and advanced data acquisition routines.

	i-CLUE-e Fast Imaging CL Plug-and-play fast CL imaging module features: Field upgradable to complete hyperspectral CL solution Ultra-compact panchromatic CL detection with PMT detection (200-900nm) Manually retractable ellipsoidal mirror with fine positioning adjustment Large field of view with High NA diamond turned mirror Driven by EM software Remote control for Contrast, Brightness, Gain , Reverse signal, High voltage
	F-CLUE-e Spectroscopy & Imaging CL Rugged Fiber coupled CL Add-on detector features: Ultra-compact multi-detector CL imaging & Spectroscopy iHR320 , 1 Entrance 2Exits ports 7 mm slits PMT 185-900 nm , integrated HV , CLLINK controller Deep cooled CCD Open Electrode 200-1100nm Fully driven by Labspec 6 Software Manually retractable ellipsoidal mirror with fine positioning adjustment Large field of view with High NA diamond turned mirror Remote control for Contrast, Brightness, Gain , Reverse signal, High voltage
	F-CLUE-p Spectroscopy & Imaging CL Fiber coupled CL Add-on detector features: Ultra-compact multi-detector CL imaging & Spectroscopy iHR320 , 1 Entrance 2Exits ports 7 mm slits PMT 185-900 nm , integrated HV , CLLINK controller Deep cooled CCD Open Electrode 200-1100nm Fully driven by Labspec 6 Software Motorized retractable parabolic mirror with fine positioning adjustment Large field of view with High NA diamond turned mirror Remote control for Contrast, Brightness, Gain , Reverse signal, High voltage
	H-CLUE-p Spectroscopy & Imaging CL Directly coupled high sensitivity CL Add-on detector features: Wide spectral range multi-detector CL imaging & Spectroscopy iHR320 , 1 Entrance 2Exits ports 7 mm slits PMT 185-900 nm , integrated HV , CLLINK controller Deep cooled CCD Open Electrode 200-1100nm Fully driven by Labspec 6 Software Motorized retractable parabolic mirror with fine positioning adjustment Large field of view with High NA diamond turned mirror Remote control for Contrast, Brightness, Gain , Reverse signal, High voltage Angle Resolved CL, Time Resolved CL, polarization…
	R-CLUE-p Spectroscopy & Imaging CL , Raman & PL Fiber coupled versatile SEM-Raman-PL-CL Add-on detector features: Field upgradable on your Raman microscope Multi-laser and multi-detector Raman, PL and CL Add-on for Scanning Electron Microscope imaging & Spectroscopy Various focal lengths spectrometers Deep cooled CCD Open Electrode 200-1100nm Fully driven by Labspec 6 Software Motorized retractable parabolic mirror with fine positioning adjustment Large field of view with High NA diamond turned mirror Remote control for Contrast, Brightness, Gain , Reverse signal, High voltage

Co-localized microscopy techniques for pyrite mineral spatial characterization

In this study we have chosen to investigate pyrite and its surrounding minerals in order to identify the different mineral phases as well as the chemical variations from micro- to nano-scale. Using the different microscopes instruments and being co-localized allows a comprehensive characterization of the sample and a precise superimposition of all the images.

Defect Evaluation of GaN Epitaxial Wafer by CL

The threading dislocation occurs easily in GaN crystal grown on sapphire substrates. It is said that this is caused by the large lattice mismatch of sapphire and GaN. The crystal may seem to be uniform in the SEM image, but the dark spot such as the threading dislocation can be observed when measuring the CL intensity image at the wavelength (362nm) which corresponds to the band edge emission.

Luminescent Defects in Synthetic CVD Diamond Films Localized by Cathodoluminescence Spectroscopy

The characterization of synthetic CVD diamond material by hyperspectral cathodoluminescence spectroscopy and imaging allows the detection and accurate location of the promising NV luminescent point defects for innovative solid-state quantum mechanical systems. In this work we performed CVD epitaxial growth on a pattern of micro-pillars etched on a diamond substrate. Cathodoluminescence (CL) analysis revealed that NV centres were successfully localized at the edges of the pillars.

The Evaluation of Phosphor for White LEDs by CL Image

Phosphor plays a key role to obtain white light as for blue LED + phosphor and near ultraviolet LED + phosphors. In order to improve high bright white LEDs, it is necessary that the whole phosphor particle emits light homogeneously. When measuring with CL the phosphor used as white LED, the area which does not emit light in phosphor particle can be observed. CL system is used for evaluation of non-luminescent area to improve luminescent efficiency and characteristics.