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Qualitative and quantitative elemental composition for:
Elemental analysis of materials is the process of identifying and quantifying the chemical elements in a sample to determine its composition. It measures the type and amount of elements present, providing insights into material composition, and is a key to assessing material performance (weight, strength, corrosion resistance, etc).
Advanced techniques are used across industries such as semiconductors, metallurgy, pharmaceuticals, and environmental science, to understand material composition, which is critical for research, quality control, and regulatory compliance. Elemental analysis is a cornerstone for ensuring material performance and driving innovation in diverse applications.
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Fingerprint analysis identifies a material’s unique elemental signature, helping determine composition, structure, and distinguishing characteristics. It is essential for verifying raw materials, ensuring batch consistency, and detecting contamination or fraud.
Typically, fingerprint analysis requires qualitative or semi-quantitative results and may be interesting to detect local defects or inhomogeneities. Elements and compounds are detected from ppm (if the specific technique allows it) to percent (%) levels, making fingerprinting crucial for quality control, material development, forensics investigation and failure analysis across industries.
X-ray Fluorescence (XRF) or Elemental Emission Spectroscopy (ICP-OES or GDOES) techniques generate spectral or elemental profiles for material authentication, forensic investigations, and counterfeit detection.
Major content analysis determines the primary elements in a material, typically at concentrations above 1% by weight, ensuring product integrity, compliance with standards, and process optimization.
Techniques such as ICP-OES (Inductively Coupled Plasma Optical Emission Spectroscopy), XRF (X-ray Fluorescence), and C/S Analyzers quantify bulk composition in metals, ceramics, and semiconductors, while GDOES (Glow Discharge Optical Emission Spectroscopy) primarily focuses on coatings. These methods help maintain quality in metallurgy, automotive, photonics components or energy (battery, fuel cells).
Trace and ultra-trace content analysis detects impurities and minor elemental components at low levels ppm, ppb or even lower, ensuring material purity, safety, and performance.
Even minimal contamination can affect semiconductor manufacturing, high-purity metals, pharmaceuticals, and environmental monitoring. Techniques such as ICP-OES and H/N/O analyzers provide high-sensitivity quantification of trace elements, identifying contaminants, dopants, and unwanted elements in critical applications.
Inductively Coupled Plasma Optical Emission Spectroscopy (ICP‑OES) provides highly sensitive elemental analysis for liquid samples and possibly some solids, such as graphite, with a dedicated accessory. It is ideal for detecting trace elements across complex matrices (brines, REE, etc.), offering high precision and a broad dynamic range. Applications include chemistry, metallurgy, energy etc.
Glow Discharge Optical Emission Spectroscopy (GDOES) enables depth-resolved analysis of solid materials, measuring elemental concentrations as a function of depth. GDOES instruments are used in universities where they contribute to the development of new materials with coatings at nanoscale and upward, and in industries to monitor photovoltaic device manufacturing, to understand the origin of corrosion, to assess the composition of precious metals, to control hard disks or LED manufacturing, to improve Li batteries, etc.
HORIBA’s X-ray Fluorescence (XRF) systems provide non-destructive elemental analysis for solids, powders, and liquids, detecting particles as small as 10 µm. Automated scanning enables detailed mapping over areas up to 10 cm × 10 cm. Ideal for industries like electronics, mining, batteries and fuel cells, and recycling, XRF delivers fast, cost-effective composition analysis. It also excels in research applications, offering high-sensitivity transition metal detection and millimeter-scale mapping, outperforming SEM-EDX in certain cases.
The EMIA Series provides precise measurement of carbon and sulfur content in inorganic solid samples, crucial for quality control in steel and metal production, metal refining at large, and ceramics. These analyzers are known for their high sensitivity, accuracy, and user-friendly operation to ensure material integrity and compliance with standard regulations.
HORIBA’s EMGA Series is designed to measure oxygen, nitrogen, and hydrogen in metals and inorganic solid materials. These instruments are widely used in metallurgy (powder and chips), ceramics, and advanced materials industries for their high sensitivity, accuracy, and user-friendly operations to ensure material integrity and compliance with standard regulation.
HORIBA offers sulfur analyzers tailored for measuring sulfur content in oils, fuels, and lubricants. These instruments help ensure compliance with environmental regulations (ASTM D4294 and ISO 8754 compliance, for instance), those governing sulfur limits in fuel, and are widely used in the petrochemical, automotive and aeronautics industries. Low chlorine levels can also be detected to prevent corrosion of the pipes (ASTM D4929).
High resolution, high sensitivity and high stability ICP-OES
Pulsed-RF Glow Discharge Optical Emission Spectrometer
X-ray Analytical Microscope (Micro-XRF)
Carbon/Sulfur Analyzer
(Flagship High-Accuracy Model)
Oxygen/Nitrogen/Hydrogen Analyzer
(Flagship High-Accuracy Model)
X-ray Fluorescence Sulfur-in-Oil Analyzer
Carbon/Sulfur Analyzer (Entry Model)
Oxygen/Nitrogen Analyzer (Entry Model)
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