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Home » Semiconductor Products Measurement Method Spectroscopic ellipsometry

Spectroscopic ellipsometry

AutoSE

Auto SE - Simple Thin Film measurement tool!

Visualize your sample and measure thin film thickness and optical constants in seconds.

"With Auto SE, routine work will never be the same!"

NEW NIR Extended Spectral Range !

UVISEL Plus

UVISEL Plus - Spectroscopic Ellipsometer FUV to NIR: 190 to 2100 nm

Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm

Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.

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