PyroSense Series

In-Situ Monitoring System

The PyroSense Series is an in-situ monitoring system for epitaxial growth processes in MOCVD/MBE. It enables inline monitoring of temperature, film thickness (growth rate), and warpage during deposition processes. As an in-situ monitoring tool for deposition equipment such as CVD, MBE, and ALD, it measures temperature via real-time emissivity, warpage via reflectivity, and film thickness (growth rate).

 

Product Line

Model Temperature Reflectivity Curvature
PyroSenseOOX
PyroCurveSenseOOO
PyroCurveSense+O (2 Ch)O (2 Ch)O
PyroCurveSense++O (3 Ch)O (3 Ch)O
Segment: Semiconductor
Division: Metrology

General Features

• Application : MOCVD, MBE, Thermal CVD
• Materials : Si, Ga(Al, In)N, SiC, GaAs, InP
• Monitoring : Emissivity corrected temperature, reflectivity and curvature
• Reflectivity : Three different wavelengths : 405, 633, 950nm
• Analysis : Growth rate and thickness
• Multi-channel : Up to 3 optical heads
• User-friendly program interface

 

Program

 

ModelPyroSensePyroCurveSense / PyroCurveSense+ PyroCurveSense++
TemperatureRange [°C]450 ~ 1,500
Resolution [°C]0.1
Accuracy [°C]±1.0
Wavelength [nm]950 ± 5
Sampling rate [Hz]1,00050,000
ReflectivityWavelength [nm]405, 633, 950 ± 5
Range [%]0 ~ 100
Resolution [%]0.1
Accuracy [%]±1.0
Growth rate
Accuracy [%]
±1.5
Sampling rate [Hz]1,00050,000
CurvatureRange [km-1]-1,400(concave) ~ +2,000 (convex)
Resolution [km-1]2.0
Accuracy [km-1]±1.0
GeneralRPM [rpm]5 ~ 120100 ~ 1,200
Power [V]AC 110~220 (50/60Hz)
Dimension [mm]
(W X H X D)
Head : 35X34X93
Controller : 250X300X90
Head 1 : 35X34X93
Head 2 : 157X58X134
Controller : 250X300X90
Head 1 : 35X34X93
Head 2 : 95X58X134
Controller : 250X300X90
Weight [kg]Head : 0.6
Controller : 3.0
Head 1 : 0.6
Head 2 : 2.0
Controller : 3.0
Head 1 : 0.6
Head 2 : 1.5
Controller : 3.0

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