Development of Portable Total Reflection X-ray Fluorescence Spectrometer with Picogram Sensitivity

By: Shinsuke Kunimura

31 August 2011


A high power X-ray source was usually used for ultra trace elemental determination with total reflection X-ray fluorescence (TXRF) analysis, and femtogram (10-15 g) detection limits were achieved with synchrotron radiation. On the other hand, we have developed portable TXRF spectrometers with a low low power (1-5 W) X-ray tube since 2006, and a 10 pg (10-11 g) detection limit was achieved with the present portable spectrometer. This result shows that using a low power X-ray tube in TXRF analysis makes it possible to perform ultra trace elemental determination. In the present paper, a summary of the present portable spectrometer is introduced.

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