Identify composition and contaminants and characterise orientation and/or crystallinity in the field or in the laboratory.

Spectroscopic ellipsometers are widely used to characterize transparent conducting oxides and thin film photovoltaics from traditional Silicon based technologies through CIGS to polymeric cells. Properties of interest are film thickness, refractive index, absorption, bandgap and silicon crystallinity.

Controlling particle size in process materials can be essential to realising a successful product with optimised performance

Rapid elemental depth profile analysis of multilayer systems, including heat-sensitive or organic layers

When the sensitivity of the optical GD system is not adequate the PP-ToF-MS provides research grade analysis of ultra trace elements/isotopes

The Ultima2 provides a versatile platform for the analysis of process materials