
Atomic Emission Spectroscopy
Material Science
Application Notes

- ICP62 : Analysis of Nd Fe B in a Magnetic Materials using ICP-OES
- ICP63 : Trace analysis in Nd Fe B Samples for Magnetic Materials using ICP-OES
- PPTOF 01 : PP-TOFMS Depth Profiling of ZnO Thin layers co-doped with Rare Earths for Photonic Materials
- GD22 : H & D Measurement of Hydrogen (and Deuterium) by RF GDOES
- GD23 : Measurement of halogen elements by RF GDOES
- GD24 : Published papers with GD data
- GD27 : Pulsed RF GDOES analysis of various inorganic materials for biomedical applications
- GD28 : Depth Profile analysis of organic and organic/inorganic multilayered materials by pulsed RF GDOES
- GD29 : Pulsed RF GDOES for the analysis of films containing metal and metal oxide nanoparticles
- GD30 : On the reproducibility of pulsed GDOES measurements
- GD31 : Application of RF GDOES to Solid Oxide Fuel Cells (SOFC)
- GD32 : Analysis of films on glass by pulsed RF GDOES
- GD34 : GDOES, the analytical companion tool for magnetron sputtering deposition
- GD35 : Pulsed RF GDOES and XPS for Depth Profile Analysis
- GD36 : Do you know what is protecting your telephone screen?
- GD37 : Quality control in the aluminium packaging industry with RF-GDOES
- GD38 : What’s protecting your mobile screen? A depth profile of polymer protection covers using Raman and UFS-GDOES
- GD39 : How to analyse your electroplated coating?
- GD40 : Analyzing drill bits with GDOES
For a list of all available application notes please click here.