Various type of analysis are possible with just one unit

The 10 µm X-ray beam brings new focus to the field of analysis.

Narrow 10um beam

Narrow 10 µm beam

With the new development of the 10 µm X-ray guide tube, which provides a higher X-ray beam concentration ratio than conventional X-ray guide tubes, HORIBA has realized a more powerful 10 µm X-ray beam. High-speed measurements are possible at speeds up to 50 times faster than conventional equipment, providing much greater usability.

Simple, Accurate Sample Positioning

Simple, Accurate Sample Positioning

The XGT-5000WR uses a structure that places the CCD sample observation image along the same axis as the X-ray beam. There is no analysis position parallax, even for samples with uneven surfaces, providing a perfect merger of sample observation operations and analysis results.

The XGT-5000WR provides an outstanding combination of operability and data accuracy.

From Micro Measurements to Macro Measurements

From Micro Measurements to Macro Measurements

The range of measurable sample area extends from a minimum diameter of 10 µm to a maximum area of 10 cm x10 cm, making the XGT-5000WR compatible with a wide range of sample sizes. This flexible system covers everything from macro analysis, for a general survey of a wide area, to the inspection of a specific micro area.

Instantaneous Analysis at Normal Atmospheric Pressure

Instantaneous Analysis at Normal Atmospheric Pressure

The XGT-5000WR uses a structure in which the vacuum is formed inside the analysis probe, which increases sensitivity to light elements.

As a result, samples can be measured at normal atmospheric pressure, so there is no need to wait until a vacuum forms in the sample chamber, and the need for preprocessing procedures such as sample drying has been eliminated.

Fluorescence X-ray Element Analysis

Fluorescence X-ray Element Analysis

The XGT-5000WR performs quick element analysis using fluorescence X-rays.

In addition to qualitative and quantitative analyses of the sample, the XGT-5000WR can also easily perform multi-point analysis, line analysis, and elemental mapping, and can even perform phase-analysis-based material analysis.

Perpendicular Transmitted Analysis

Perpendicular Transmitted Analysis

The XGT-5000WR can obtain transmitted X-ray images, so it can be used to easily observe internal areas of electronic parts, etc., and to perform structural analyses.

Scanning is done with a narrow perpendicular beam that does not scatter, resulting in clear penetrating images even for non-flat samples such as cylindrical parts.

Internal Analysis and Foreign Material Analysis

Internal Analysis and Foreign Material Analysis

The irradiated X-rays penetrate into the sample, providing transmitted images and also making it possible to obtain information about the elements inside the sample.

Analysis of Samples Containing Water

Analysis of Samples Containing Water

With HORIBA's original vacuum probe, no sample pre-treatment is needed and analysis is performed with the sample at normal atmospheric pressure. As a result, samples containing water, even plants and animals, can be measured and analyzed.

There is no damage to the sample, making the XGT-5000WR well suited for medical and biological applications as well.