Ellipsometers
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- American Vacuum Society (AVS), November 6-11, Nashville, TN
- Materials Research Society (MRS) Fall, November 27-December 2, Boston, MA
Ellipsometry Application Notes
Spectroscopic ellipsometers are the perfect tools for measuring thin film thickness and optical constants (n and k) with high accuracy for single and multiple layer thin film structures. Thickness determinations range from a few angstroms to tens of microns. Characterization of advanced material properties are also possible such as: anisotropic structures, graded and non-uniform layers, alloy composition.
Widely used in semiconductor research and microelectronic industries, ellipsometers enable users to characterize thin film thickness, optical constants, bandgap, crystallinity, interface and more of multilayer structures on a large spectral range from DUV to NIR. Read More
Spectroscopic ellipsometers are widely used in flat panel display industries and in R&D of flexible displays. Ellipsometers enable users to characterize thin film thickness, optical constants, material uniformity and morphology on a large spectral range from FUV to NIR. Read More
For non-destructive thin film characterization in material research, ellipsometers enable users to characterize thin film thickness, optical constants and many other material properties of nano and micro layers. Read More
Spectroscopic ellipsometers are the perfect tools for the characterization of optical coatings by delivering accurate thin film thickness and optical constants results. Ellipsometers also allows the characterization of interface, roughness, gradient and anisotropy. Read More
Spectroscopic ellipsometers are widely used to characterize thin film photovoltaics. Properties of interest are film thickness, refractive index, absorption, bandgap and silicon crystallinity. Read More
Spectroscopic ellipsometers are flexible and non-destructive systems for use in biotechnology and surface chemistry. The analysis of surface organic coating or the dynamic study of chemical phenomena in liquid ambient is possible by ellipsometry. Read More
Spectroscopic ellipsometers are used for optoelectronic thin film structures analysis such as LED. Film thickness, optical constants and alloy composition are the properties of interest. HORIBA Scientific’s patented sample vision system provides the advantage to visualize and position the measurement spot inside a LED pixel. Read More
