Spectroscopic ellipsometers are used for optoelectronic thin film structures analysis such as LED. Film thickness, optical constants and alloy composition are the properties of interest. HORIBA Scientific’s patented sample vision system provides the advantage to visualize and position the measurement spot inside a LED pixel.

Application Notes

  • SE-27:Characterisation of LED Thin Film Devices by Spectroscopic Ellipsometry
  • SE-05:Porous Silicon Composite Material
  • SE-24:VO2 Smart Materials

For a list of all available application notes please click here.

Ellipsometry for Organic Webinar