Ellipsometers
Semiconductor
Widely used in semiconductor research and microelectronic industries, ellipsometers enable users to characterize thin film thickness, optical constants, bandgap, crystallinity, interface and more of multilayer structures on a large spectral range from DUV to NIR.
Application Notes
- SE-02:Optical Characterization of Organic Semiconductors by Spectroscopic Ellipsometry
- SE-21:High k Dielectric with Nanoscale Thickness Studied by VUV spectroscopic Ellipsometry & FTIR-ATR
- SE-13:Characterization of III-V Semiconductors using Phase Modulated Spectroscopic Ellipsometry
- SE-01:Spectroscopic Ellipsometry of Compound Semiconductors: AlxGa1-xN / GaN Hetero-Structures
- SE-16:Ferroelectric Thin Films Characterization by Spectroscopic Ellipsometry PbZr1-xTixO3 & BA1-xSrxTiO3
For a list of all available application notes please click here.
