Ellipsometers
See us at
- American Vacuum Society (AVS), November 6-11, Nashville, TN
- Materials Research Society (MRS) Fall, November 27-December 2, Boston, MA
Spectroscopic Ellipsometers
HORIBA Scientific’s ellipsometers incorporate non-rotating phase modulation and liquid crystal modulation technologies to provide the most sensitive and accurate ellipsometric measurement on a large spectral range from VUV to NIR.
In addition to thin film thickness and optical constants characterization, ellipsometric analysis provides rich information on material properties such as anisotropy, gradient, morphology, crystallinity, chemical composition and electrical conductivity.
Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm
Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.
The UVISEL 2 VUV delivers the fastest thin film measurements over the largest wavelength range spanning from 147 nm to 2100 nm.
Visualize your sample and measure thin film thickness and optical constants in seconds.
"With Auto SE, routine work will never be the same!"
NEW NIR Extended Spectral Range !
Versatile spectroscopic ellipsometer delivering research grade performance at an economical price.
