Nanolog® - Our modular Spectrofluorometer for Nanotechnology


  • Description

  • Features

  • Nanosizer® Software



The Nanolog® series of spectrofluorometers are specifically designed for research in nanotechnology and the frontiers of nanomaterials. Based on the world-wide proven technology of the FluoroLog®, the NanoLog® detects fluorescence in the near-IR from 800 to 1700 nm (optional multi-channel detection to 2 µm, single-channel detection to 3 µm), with visible and UV options possible. With the NanoLog® comes specially designed software ideal for classifying SWNTs, performing energytransfer calculations, and saving custom routines and instrument layouts. A complete spectrum can be scanned as fast as a few milliseconds, and a full excitation-emission matrix scan can be taken in as little as seconds.

Nanolog - Perfect for quantum dots, too!



Features Rapid excitation-emission matrices in seconds High sensitivity in near-IR with InGaAs array High resolution Eases qualification and quantification of species and families of SWNTs Compatible with variety of detectors from UV to near-IR:Photomultiplier tube for highest sensitivity and timeresolved analysisPopular, cost-effective single-element InGaAsMulti-element CCD array for fast data-acquisition Resolve mixtures of quantum dots simultaneously Perform energy-transfer experiments Modular design for your ideal experimental setup.


Nanosizer® Software

Nanosizer® - for Single‐Walled Carbon Nanotube Excitation‐Emission Map Simulation and Analysis

Nanosizer® in Origin® Pro 8 simplifies the process for simulation and analysis for single‐walled carbon nanotube excitation‐emission map simulation and analysis. Nanosizer is used with our Nanolog spectrofluorometers, which are specifically designed for research in nanotechnology and nanomaterials. Nanosizer comes with our patented double-convolution-integral algorithm specially designed for determining chirality and diameter of single-walled carbon nanotubes.

Nanosizer® lets you simulate excitation-emission maps of SWNT near-IR fluorescence to compare to your actual data. Using built-in or custom libraries, Nanosizer® rapidly assigns specific peaks to particular SWNT (n,m) structures, and even generates helical maps. Nanosizer® also greatly simplifies FRET studies of SWNT bundles, length-distribution analyses, and nanotube purification analyses. Nanosizer®even offers a platform suitable to support future ISO and ASTM standards for identification and purification of semiconducting SWNTs.

Click here to download the Nanosizer brochure

Perfect for FRET in SWNT Bundles, Length Distribution Analysis, and Purification applications

Features and Benefits of Nanosizer® in OriginPro® 8

  • Efficient Region of Interest and Initial Model Parameterization
  • Virtually unlimited number of peaks
  • Global linking and fixing of peak parameters
  • Full constraints on all model peak parameters
  • Save Themes for rapid model parameterization
  • 2D analytical line shapes: Gaussian, Lorentzian and Voigt Convolution
  • Correct statistical weighting of residuals
  • Fully featured statistical analysis of fit peak parameters
  • Graphical and tabular presentation of fit results and residuals
  • Fits data in energy (cm–1, eV) or wavelength (nm) units
  • Compares peak parameters to user editable library for helix angle, diameter and (n,m) distribution plots and tables
  • Designed for ISO and ASTM Standards for Semiconducting SWNT Identification/Quantification

Manufactured by HORIBA Scientific


  • 450 W intense broadband cw xenon lamp for bright excitation from UV to near-IR
  • Full excitation-emission matrices in seconds
  • Symphony II InGaAs array detectors: 800-1700 nm; 256 x 1,512 x 1, and 1024 x 1 pixel formats as small as 25 µm pitch; noise as low as 650 erms with liquid-nitrogen cooling for best signal-to-noise ratio; optional thermoelectric cooling; extended range option (1.1 - 2.2 µm)
  • iHR320 emission spectrograph: focal length = 320 mm; f/4.1; dispersion = 2.31 nm/mm; resolution = 0.06 nm (with slit); software-controlled triple-grating turret (all measured with 1200 grove/mm grating)
  • Solid-state near-IR detectors, photomultiplier tubes from UV to near-IR, time-correlated single-photon counting lifetime measurement (100 ps to 1 ms, UV to near-IR), phosphorimeter (1 µs to > 10 s, UV to near-IR), and frequency-domain lifetime measurement (10 ps to 10 µs, UV to near-IR) are also available


Schematic of the NanoLog, showing the optical path from source through sample to detectors