- Example of depth profile of 300 nm tantalum oxide layer showing three resolved 50 nm thick O18 enriched layers (Sample from University of Manchester).
Boron diffusion
Oxides
- A. Baron Wiecheć, A. Tempez, P. Skeldon, P. Chapon, and G. E. Thompson, 18O distributions in porous anodic alumina by plasma profiling time-of-flight mass spectrometry and nuclear reaction analysis Surface and Interface Analysis, 2012, 44, 1346-1352. DOI 10.1002/sia.5032
- I. S. Molchan, G. E. Thompson, P. Skeldon, N. Trigoulet, A. Tempez, P. Chapon, N. Tuccitto, A. Licciardello, “Differentiation of 18O and 16O-rich layers in anodic alumina films by glow discharge time-of-flight mass spectroscopy", Surface and Interface Analysis, 42, 211-214 (2010). DOI: 10.1002/sia.3227
- A. Tempez, S. Canulescu, I. S. Molchan, M. Döbeli, J. A. Whitby, L. Lobo, J. Michler, G. E. Thompson, N. Bordel, P. Chapon, P. Skeldon, I. Delfanti, N. Tuccitto, A. Licciardello “18O/16O isotopic separation in anodic tantala films by glow discharge time-of-flight mass spectrometry”, Surface and Interface Analysis, 41, 966-973 (2009). DOI: 10.1002/sia.3129
