
Raman Spectroscopy
Can Raman and AFM measurements be made on the same instrument?
Yes, it is possible to combine Raman and AFM analysis on a single microscope system.
The combination of Raman with an atomic force microscope (AFM) opens up interesting new capabilities and provides new information on sample composition and structure. Combined Raman-AFM systems can provide topographic sample information on the nanoscale. Combine this with the chemical information obtained from Raman spectral images and a more comprehensive sample characterisation can be obtained.
Techniques such as tip enhanced Raman scattering (TERS) can also be undertaken with such systems, to open up the potential for true nanoscale Raman analysis.
AFMs from most manufacturers can be coupled to Raman microscopes, in a variety of configurations:
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Can Raman and AFM measurement be made on the same instrument?
Yes it is possible to combine AFM and Raman analysis on a single system. Please visit our AFM-Raman platform page for more information on fully integrated solutions by HORIBA Scientific.