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New Atomic Force Microscope with Chemical Identification

SignatureSPM: Scanning Probe Microscope with Chemical Signature
Product Page | Brochure

Raman Spectroscopy

XploRA Plus: Raman Spectrometer - Confocal Raman Microscope
Product Page | Brochure

LabRAM Soleil: Multimodal Confocal Raman Microscope
Product Page | Brochure

LabRAM Evolution: Confocal Raman Imaging & High Resolution Spectrometer
Product Page | Brochure

LabRAM Evolution Semiconductor: Photoluminescence and Raman Wafer Imaging
Product Page | Brochure

MacroRAM: Affordable Benchtop Raman Spectrometer
Product Page | Brochure

LabSpec 6: Spectroscopy Suite Software
Product Page | Brochure

Fluorescence Spectroscopy

Aqualog - A-TEEM Industrial QC/QA Analyzer: A Simple, Fast, “Column Free” Molecular Fingerprinting Technology
Product Page | Brochure

Delta Flex: TCSPC/MCS Fluorescence Lifetime System
Product Page | Brochure

FluoroMax Plus: Steady State and Lifetime Benchtop Spectrofluorometer
Product Page | Brochure

Fluorolog-QM: Modular Research Fluorometer for Lifetime and Steady State Measurements
Product Page | Brochure

Duetta: Fluorescence and Absorbance Spectrometer
Product Page | Brochure

Elemental Analysis

XGT-9000: X-ray Analytical Microscope (Micro-XRF)
Product Page | Brochure

MESA-50K: X-Ray Fluorescence Analyzer
Product Page | Brochure

D-Profiler 2: Elemental surface analysis and depth profiling
Product Page | Brochure

EMIA-Expert: Carbon/Sulfur Analyzer
Product Page | Brochure

EMGA-Expert: Oxygen/Nitrogen/Hydrogen Analyzer
Product Page | Brochure

Optical Spectroscopy

SMS: Smart Microscope Spectroscopy
Product Overview Page | Brochure

iHR-Series: Mid-Focal Length Imaging Spectrometers
Product Page | Brochure

Clue: Cathodoluminescence Solutions for Electron Microscopy
Product Page | Brochure

Thin Film Analysis

Uvisel Plus: Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm
Product Page | Brochure

Smart SE: Powerful and Cost Effective Spectroscopic Ellipsometer
Product Page | Brochure

Auto SE: Spectroscopic Ellipsometer for Simple Thin Film Measurement
Product Page | Brochure

Particle Characterization Analysis

Partica LA-960V2: Laser Scattering Particle Size Distribution Analyzer
Product Page | Brochure

nanoPartica SZ-100V2: Nanoparticle Analyzer
Product Page | Brochure

Partica mini LA-350: Laser Scattering Particle Size Distribution Analyzer
Product Page | Brochure

PSA Guidebook 2022: Overview of PCA principles and systems
Guidebook Page with Related Products | Brochure

In-Line XRF Monitoring

In-Line XRF Monitoring: Real-time XRF analysis and control for roll-to-roll coating processes
Solution Page | Brochure

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