Event
Beginning: 01/22/26
Location: Online
Two sessions are available for this webinar:
- 9 AM GMT / 10 AM CET / 5 PM CST / 6 PM JST
- 4 PM GMT / 5 PM CET / 8 AM PST / 11 AM EST
Correlative microscopy combines information from multiple instruments — such as SEM, Raman, AFM, and CL — to build a complete view of a material’s structure and chemistry. The main challenge lies in accurately aligning these datasets across different techniques while maintaining traceability.
This webinar presents practical methods to achieve precise positioning, correct for drift, and merge multimodal data in both 2D and 3D. Together, these steps form a straightforward and reliable workflow for traceable correlative microscopy. Examples from semiconductors, 2D materials, and advanced coatings will illustrate how such approaches enhance precision, reproducibility, and productivity in both research and industry.
Key Learning Objectives
- Understand what traceable alignment means and why it matters in correlative microscopy
- Learn how to achieve precise positioning between instruments
- See how image registration and drift correction improve data accuracy
- Discover how to combine and visualize multimodal datasets in 2D and 3D
- Explore real examples demonstrating gains in accuracy, speed, and reproducibility
Who Should Attend
- Researchers in materials science, semiconductors, and life sciences seeking to correlate micro- and nanoscale measurements
- Microscopists and spectroscopists are interested in combining AFM, SEM, Raman, CL, and optical data
- Metrologists working on measurement traceability and uncertainty control
- Engineers and lab managers implementing multi-instrument workflows in R&D or QC environments
