CCM/MEA Catalyst Coating Monitor XV-100

CCM/MEA Catalyst Coating Monitor

Fast, Non-destructive, and High-Precision Elemental Analysis Customized to Your Process

HORIBA’s XV-100 is an in-line XRF analyzer designed for precise, non-destructive measurement of platinum group metals (PGMs) including platinum and iridium in catalyst-coated membranes/membrane electrode assembly (CCM/MEA) used in fuel cells and electrolyzers. These noble metals are essential for performance but are expensive and limited in supply.

The XV-100 helps manufacturers ensure quality, reduce waste, and optimize material usage during the coating process. With real-time monitoring, 24/7 operation, and no sample preparation required, it optimizes quality control while minimizing material waste. Its durable X-ray tube designed to operate for 10,000 hours, direct PLC connectivity, and scalable integration across production lines ensure high operational reliability. The compact, PC-less design allows for flexible installation in various industrial environments. Backed by over 50 years of HORIBA expertise, the XV-100 supports high-efficiency manufacturing for next-generation energy devices.

Key Features:

Seamless Integration: Designed for easy integration into roll-to-roll processes, complete with X-ray protection measures.
Modular Software: Highly connective and modular software facilitates in-line process monitoring.
Compatibility: Compatible with standard communication protocols for streamlined integration into existing systems.

1. Optimizing Catalyst Use in Fuel Cell and Electrolyzer Manufacturing

To achieve carbon neutrality, green hydrogen is a crucial energy source. Both electrolyzers and fuel cells use catalyst-coated, semi-permeable membranes to separate reactants (MEA: Membrane Electrolyte Assembly). These membranes (PEMFC*) have multiple layers, one of which contains platinum or other platinum group metals (PGMs) as catalysts. However, PGMs are precious materials and require strict quality control with non-destructive analysis methods. HORIBA introduces Inline X-ray fluorescence analysis (XRF) that achieves highly reliable and precise non-contact measurement and control functionality of the PGM content in this layer.

_{*Proton Exchange Membrane Fuel Cell}

2. Why Choose Inline XRF for Catalyst Quality Control?

3. Advantages of HORIBA XV-100

Based on more than 50 years of experience in X-ray technology and manufacturing process analysis, we have designed the XV-100 for process analysis.

Realtime energy correction allows stable operation
Integrated distance correction for objects with large vertical fluctuations
Durability of X-ray tube (10,000 hours^*1)
Achieve high sensitivity at industry-leading measurement speeds
Compact, lightweight design allows flexible installation in any location

4. Seamless Integration with Your Production Systems

Connectable to industrial network via PLC* or PC
Multiple devices (XRF units, other companies’ devices such as coaters) can be synchronized and measured
HORIBA’s original firmware and built in microprocessor designed for direct PLC connectivity (stable operation without conventional method of PC)

_{* Programmable Logic Computer}

5. Intuitive Software Designed for Industrial Efficiency

Software GUI for standalone operation with XV-100

6. Set up: Roll to Roll Coating Inspection for Fuel Cell and Electrolyzer

When the CCM* passes the measurement point of the XV-100, the amount of Pt corresponding to the catalyst thickness is displayed on the graph. When the organic film passes, it is not detected.
_{*Catalyst Coated Membrane}

7. Additional Capabilities

XV-100 is a standalone monitor, but it can also meet additional requirements such as traverse units, X-ray shielding mechanisms, and data transmission.

Measurement principle	X-ray Fluorescence
Selectable element range^※1	Pt, Ir
Detector	Silicon Drift Detector
X-ray tube target	Ag
X-ray voltage	6 - 50 kV
X-ray current	50 - 200 μA
Measurement frequencies	10 ms - 60 min^※2
Data Interface^※3	Modbus/TCP^Ⓡ, OPC-UA^Ⓡ, 100 Mbps
Dimensions	230 (W) × 208 (D) × 132 (H) mm
Weight	Approx. 7 kg

※1 Custom additions for other elements can be made available upon request.
※2 Measurement frequencies are adjustable to suit various production needs.
※3 MODBUS is a registered trademark of Schneider Electric USA Inc. OPC UA is a trademark of OPC Foundation.
This product uses a laser (Class 2). Specifications are subject to change without notice.

With in-line X-ray fluorescence measurement, you can accurately determine material thickness or element loading in real-time during production, eliminating the need to remove products for time-consuming laboratory analysis.

XV-100