Spectroscopic Ellipsometers

HORIBA Scientific’s ellipsometers incorporate non-rotating phase modulation and liquid crystal modulation technologies to provide the most sensitive and accurate ellipsometric measurement on a large spectral range from VUV to NIR.

In addition to thin film thickness and optical constants characterization, ellipsometric analysis provides rich information on material properties such as anisotropy, gradient, morphology, crystallinity, chemical composition and electrical conductivity.

New Uvisel 2

The ultimate solution to every challenge in thin film measurement

UVISEL Plus

Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm

Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.

UVISEL VUV

The UVISEL 2 VUV delivers the fastest thin film measurements over the largest wavelength range spanning from 147 nm to 2100 nm.

AutoSE

Visualize your sample and measure thin film thickness and optical constants in seconds.

"With Auto SE, routine work will never be the same!"

NEW NIR Extended Spectral Range !

Smart SE

Versatile spectroscopic ellipsometer delivering research grade performance at an economical price.