For Semiconductor manufacturing processes, where the most advanced micro-fabrication techniques are used, quality management is a critical issue that directly impacts business.
It is important to constantly inspect for the presence of particle contamination. By making use of advanced analysis technologies, HORIBA provides cost effective leading-edge particle detection solution to semiconductor manufactures.
Reticle / Mask Particle Detection System
Reticle/Mask Particle Remover
Você tem alguma dúvida ou solicitação? Utilize este formulário para entrar em contato com nossos especialistas.
